RF CIRCUIT NONLINEARITY CHARACTERIZATION AND MODELING FOR EMBEDDED TEST By CHOONGEOL CHO A DISSERTATION PRESENTED TO THE GRADUATE SCHOOL OF THE UNIVERSITY OF FLORIDA IN PARTIAL FULFILLMENT OF THE REQUIREMENTS FOR THE DEGREE OF DOCTOR OF PHILOSOPHY

Oscar D. Crisalle for their interest in this work and their guidance as the thesis committee members. I thank Motorola Company for financial support. I also thank Bob Stengel and Enrique Ferrer for their dedication to my research. In addition, I thank all of the friends who made my years at the University of Florida such an enjoyable chapter of my life. I am grateful to my parents and parents in law for their unceasing love and dedication. Finally, I thank my wife, Seon-Kyung Kim, whose endless love and encouragement were most valuable to me. Most importantly, I would like to thank God for guiding me everyday.